Chalcogenide glass thin films have emerged as a focal point in photonics and optoelectronics owing to their distinctive optical characteristics, including high refractive indices, broad infrared ...

Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

In order to meet material demands of nanotechnology, new classes of material combinations need exploration. We have investigated the UV and VUV optical properties of various metal, oxide, nitride, ...

Thin films can be made from a variety of materials, including metals (e.g., gold, silver), oxides (e.g., silicon dioxide, titanium dioxide), and semiconductors (e.g ...

AFM facilitates atomic resolution imaging of insulator and conductor surfaces. One of the techniques utilizing AFM is frequency-modulation AFM (FM-AFM), which has been used for the atomic-resolution ...

Thin films form the basis of many industries today, including semiconductors, electric vehicles, smart optical coatings, sophisticated medical equipment, and protective layers on high-temperature ...

The introduction of several new dielectric materials for high-speed ultra-large-scale integration (ULSI) microelectronics has increased the necessity for metrology tools to measure the ...

Thin films are two-dimensional (2D) material layers deposited on a bulk substrate, possessing a thickness of a few nanometers to impart properties that cannot be realized by base materials. The unique ...

Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...