Nasdaq

Aehr Receives First Order for FOX(TM) Wafer Level Test and Burn-in System to be used for Gallium Nitride Semiconductor Engineering and Qualification

FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...

William Blair upgrades Aehr Test Systems, Inc. (AEHR) to outperform from market perform – here’s why

Aehr Test Systems, Inc. (NASDAQ:AEHR) is one of the best semiconductor equipment stocks to invest in now. Aehr Test Systems, ...
Semiconductor Engineering

Managing Wafer Retest

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
EDN

ChipMOS Intros High-Speed Wafer Tester

Taiwanese test and assembly provider ChipMOS Technologies (Bermuda) Ltd. today said it has developed a wafer tester for probe testing 32 in parallel DDR DRAM at 200MHz clock rates and 400Mbit data ...
Seeking Alpha

Aehr Test Systems Announces Wafer Level Burn-in and Test Application Evaluation Order from Leading AI Processor Supplier

FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order from a ...
News-Press NOW

Aehr Receives $14 Million Order from Lead AI Processor Customer for Multiple New Fully Automated FOX-XP Wafer Level Burn-In Systems

FREMONT, CA / / February 26, 2026 / Aehr Test Systems (NASDAQ:AEHR), a leading provider of test and burn-in solutions for ...
Nasdaq

Aehr to Showcase FOX-P™ Wafer-Level, Die and Module Test Solutions at Virtual SWTest Untethered 2020 Conference on November 11

FREMONT, Calif., Nov. 09, 2020 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, will be showcasing its FOX-P™ ...
Seeking Alpha

Aehr Test Systems and ISE Labs Announce Partnership on Wafer-Level Test and Burn-in for High-Performance Computing and Artificial Intelligence Processors

FREMONT, CA / ACCESS Newswire / November 3, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in solutions, today announced a strategic partnership with ISE Labs, ...
Business Wire

Hprobe Receives Order from a Tier-1 Semiconductor Manufacturer for a Wafer-Level Magnetic Tester to be Used for Strategic R&D of Magnetic Materials and Devices

GRENOBLE, France--(BUSINESS WIRE)--Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a significant order from a tier-1 semiconductor ...

Aehr Test Systems: Aehr Receives Follow-On Order for Fully Automated Wafer-Level Burn-In Systems Powering AI Optical I/O and Data Center Interconnects

FREMONT, CA / ACCESS Newswire / March 3, 2026 / Aehr Test Systems (NASDAQ:AEHR), a leading provider of test and burn-in solutions for semiconductor devices used in artificial intelligence (AI), data c ...
EDN

Wafer test system

The S680 DC/RF parametric test system controls 300-mm wafer processes in the same time it takes to test 200-mm wafers using the SimulTest parallel test software option, which measures up to nine ...
Semiconductor Engineering

Wafer Test Challenges For Chiplets

In a heterogeneous integrated system, the impact of composite yield fallout due to a single chiplet is creating new performance imperatives for wafer test in terms of test complexity and coverage.