Semiconductor test engineers can expect to increasingly confront problems related to RF, memory, and compression-based-scan test; timing and jitter measurements; design for manufacturability (DFM); ...

The final session will be a presentation on examples of RF exposure problems, including measurement equipment and techniques that take into account operator-induced uncertainty, presented by Doczkat ...

Wireless InSite Release 4.0 supports rigorous simulation of dynamic and complex radio frequency (RF) environments, including ...

Very Inexpensive RF Module Tutorial 39 Comments by: Brian Benchoff August 19, 2012 ...

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